2 article(s) from Miyahara, Yoichi

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

  • Aaron Mascaro,
  • Yoichi Miyahara,
  • Tyler Enright,
  • Omur E. Dagdeviren and
  • Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

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Review
Published 01 Mar 2019

Improved atomic force microscopy cantilever performance by partial reflective coating

  • Zeno Schumacher,
  • Yoichi Miyahara,
  • Laure Aeschimann and
  • Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

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Published 03 Jul 2015
 
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